Electrically erasable programmable read-only memory with NAND ce

Details Electrically erasable programmable read-only memory with NAND ce Electrically erasable programmable read-only memory with NAND ce

1988-12-27

1990-09-25

Popek, Joseph A.

Static information storage and retrieval

Floating gate

Particular biasing

365104, 357 235, G11C 1700

Patent

active

049598120

ABSTRACT:
An erasable programmable read-only memory with NAND cell structure is disclosed which has memory cells provided on a N type substrate. The memory cells are divided into NAND cell blocks each of which has a series array of memory cell transistors. Each of the transistors has a floating gate, a control gate connected to a word line and N type diffusion layers serving as its source and drain. These semiconductor layers are formed in a P type well layer formed in a surface area of a substrate. The well layer serves as a surface breakdown prevention layer. During a data erase mode data stored in all the memory cells are erased simultaneously. During the data write mode subsequent to the erase mode, when a certain NAND cell block is selected, memory cells in the NAND cell block are subjected to data writing in sequence. When data is written into a certain memory cell in the selected NAND cell block, a control gate of the certain memory cell is supplied with a voltage which is so high as to form a strong electric field to allow the tunneling of electrons between the floating gate of the memory cell and the well layer. Consequently, only the selected cell can be written into.

REFERENCES:
patent: 4677590 (1987-06-01), Arakawa
"A High Density EPROM Cell and Array", Symposium on VLSI Technology Digest of Technical Papers; pp. 89-90; May 1986; R. Stewart et al.

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