Static information storage and retrieval – Read/write circuit – Erase
Patent
1994-10-31
1996-06-18
Nelms, David C.
Static information storage and retrieval
Read/write circuit
Erase
365182, 36518505, G11C 700, G11C 1134
Patent
active
055285473
ABSTRACT:
A NAND cell type EEPROM has bit lines, each of which is associated with a NAND cell unit including a series array of four memory cell transistors. Each transistor is a MOSFET with a control gate and a floating gate for data storage. The memory cell transistors are connected at their control gates to word lines, respectively. One end of the NAND cell unit is connected through a first select transistor to a corresponding bit line; the other end thereof is connected via a second select transistor to a source voltage. The memory cell transistors and the select transistors are arranged in a well region formed in a substrate. In an erase mode, the bit line voltage, the substrate voltage and the well voltage are held at a high voltage, whereas the word lines are at zero volts. The gate potential of the select transistors is held at the high voltage, whereby the internal electric field of these select transistors is weakened to improve the dielectric breakdown characteristic thereof.
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patent: 5084843 (1992-01-01), Mitsuishi et al.
patent: 5101381 (1992-03-01), Kouzi
patent: 5136541 (1992-08-01), Arakawa
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patent: 5341329 (1994-08-01), Takebuchi
A 5V-Only EEPROM with Internal Program/Erase Control; Art Lancaster, Bob Johnstone, Jeff Chritz, Gerry Talbot, David Wooten; Inmos Corp., Colorado Springs; paper 4.7; reprinted from the IEEE ISSCC Dig. Tech. Pap., pp. 164-165, 302, 1983.
Aritome Seiichi
Iwata Yoshihisa
Kirisawa Ryouhei
Momodomi Masaki
Shirota Riichiro
Dinh Son
Kabushiki Kaisha Toshiba
Nelms David C.
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