Electrical through-plating of semiconductor chips

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Physical stress responsive

Reexamination Certificate

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Details

C438S050000, C438S052000, C438S514000, C438S659000, C257S415000, C257S417000, C257S419000, C257SE21481

Reexamination Certificate

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07572660

ABSTRACT:
A method for manufacturing a micromechanical component and a micromechanical component manufactured using this method are described, the micromechanical component having a first substrate, which in turn has at least one cavity and one printed conductor. At least a part of the printed conductor is applied to at least a part of the walls of the cavity. In particular, the floor of the cavity is considered part of the cavity walls.

REFERENCES:
patent: 5202281 (1993-04-01), Ishibashi
patent: 5879572 (1999-03-01), Folsom et al.
patent: 5994161 (1999-11-01), Bitko et al.
patent: 6030851 (2000-02-01), Grandmont et al.
patent: 6287885 (2001-09-01), Muto et al.
patent: 6417021 (2002-07-01), Vigna et al.
patent: 6682649 (2004-01-01), Petersen et al.
patent: 6768291 (2004-07-01), Isogai et al.
patent: 6971266 (2005-12-01), Kawai
patent: 2004/0104454 (2004-06-01), Takaoka et al.
patent: 100 42 945 (2002-03-01), None
patent: 100 58 864 (2002-06-01), None

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