Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to nonconductive state
Reexamination Certificate
2010-07-29
2011-10-18
Wilczewski, Mary (Department: 2822)
Semiconductor device manufacturing: process
Making device array and selectively interconnecting
Using structure alterable to nonconductive state
C438S381000, C257SE21001, C365S096000
Reexamination Certificate
active
08039321
ABSTRACT:
Provided are an electrical fuse, a semiconductor device having the same, and a method of programming and reading the electrical fuse. The electrical fuse includes first and second anodes disposed apart from each other. A cathode is interposed between the first and second anodes. A first fuse link couples the first anode to the cathode, and a second fuse link couples the second anode to the cathode.
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Lee Jae-Ho
Maeda Shigenobu
Nam Myung-Hee
F. Chau & Associates LLC
Samsung Electronics Co,. Ltd.
Thomas Toniae
Wilczewski Mary
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