Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate
2006-08-22
2006-08-22
Nguyen, Tuan T. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Having fuse element
C365S189050, C365S189090
Reexamination Certificate
active
07095671
ABSTRACT:
Electrical fuses (eFuses) are applied to the task of memory performance adjustment to improve upon earlier fuse techniques by not requiring an additional processing step and expensive equipment. Standard electrical fuse (eFuse) hardware chains provide a soft test feature wherein the effect of memory slow-down can be tested prior to actually programming the fuses. Electrical fuses thus provide a very efficient non-volatile method to match the logic-memory interface through memory trimming, drastically cutting costs and cycle times involved.
REFERENCES:
patent: 5912852 (1999-06-01), Lawrence et al.
patent: 5995424 (1999-11-01), Lawrence et al.
patent: 6198682 (2001-03-01), Proebsting
patent: 6373747 (2002-04-01), Harari et al.
patent: 6462998 (2002-10-01), Proebsting
Agarwala Sanjive
Graber Joel J.
Krishnan Manjeri
Le Duy-Loan
Sheffield Bryan
Brady III W. James
Marshall, Jr. Robert D.
Nguyen Tuan T.
LandOfFree
Electrical fuse control of memory slowdown does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electrical fuse control of memory slowdown, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrical fuse control of memory slowdown will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3712907