Efficient SAT-based unbounded symbolic model checking

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000

Reexamination Certificate

active

11087898

ABSTRACT:
An efficient approach for SAT-based quantifier elimination and pre-image computation using unrolled designs that significantly improves the performance of pre-image and fix-point computation in SAT-based unbounded symbolic model checking.

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