Electrical computers and digital processing systems: memory – Storage accessing and control – Control technique
Reexamination Certificate
2009-09-24
2010-10-19
Bragdon, Reginald G (Department: 2189)
Electrical computers and digital processing systems: memory
Storage accessing and control
Control technique
C711S103000, C711SE12001, C365S185250
Reexamination Certificate
active
07818525
ABSTRACT:
Methods and apparatuses for reduction of Read Disturb errors in a NAND FLASH memory system comprise a controller configured to organize FLASH memory devices into blocks, each block having a plurality of pages, and each page defining an individually addressable physical memory location. The controller is further configured to accumulate a Block READ Count corresponding to the number of times any pages in a first block of pages have been read since the first block was last erased. Once the READ count reaches a predetermined number, the controller responds to subsequent READ requests for pages within the first block by moving data associated with a requested page to a page in a second, different block without moving data associated with other pages in the first block, and modifying a logical-to-physical translation table to associate the moved data with the physical address of the page in the second block.
REFERENCES:
patent: 5170400 (1992-12-01), Dotson
patent: 5875456 (1999-02-01), Stallmo et al.
patent: 6115837 (2000-09-01), Nguyen et al.
patent: 6158017 (2000-12-01), Han et al.
patent: 6282039 (2001-08-01), Bartlett
patent: 6311251 (2001-10-01), Merritt et al.
patent: 6347359 (2002-02-01), Smith et al.
patent: 6516425 (2003-02-01), Belhadj et al.
patent: 6570785 (2003-05-01), Mangan et al.
patent: 6718437 (2004-04-01), Don et al.
patent: 6795895 (2004-09-01), Merkey et al.
patent: 7099190 (2006-08-01), Noguchi et al.
patent: 7120826 (2006-10-01), Fore et al.
patent: 7162678 (2007-01-01), Saliba
patent: 7173852 (2007-02-01), Gorobets et al.
patent: 7299401 (2007-11-01), Fukuda
patent: 7328307 (2008-02-01), Hoogterp
patent: 7405964 (2008-07-01), Philipp et al.
patent: 7409492 (2008-08-01), Tanaka et al.
patent: 7437600 (2008-10-01), Tachikawa
patent: 7454639 (2008-11-01), Jain et al.
patent: 7502886 (2009-03-01), Kowalchik et al.
patent: 7577866 (2009-08-01), Fan et al.
patent: 7721146 (2010-05-01), Polisetti et al.
patent: 2005/0086575 (2005-04-01), Hassner et al.
patent: 2005/0144363 (2005-06-01), Sinclair
patent: 2007/0232906 (2007-10-01), Alexandru
patent: 2008/0016435 (2008-01-01), Goel
patent: 2008/0059707 (2008-03-01), Makineni et al.
patent: 2008/0098158 (2008-04-01), Kitahara
patent: 2008/0288436 (2008-11-01), Priya
patent: 2008/0288814 (2008-11-01), Kitahara
patent: 2009/0172254 (2009-07-01), Chen
patent: 2009/0172335 (2009-07-01), Kulkarni
patent: 2009/0193174 (2009-07-01), Reid
patent: 2009/0193314 (2009-07-01), Melliar-Smith et al.
patent: 2009/0240873 (2009-09-01), Yu et al.
patent: 2010/0005228 (2010-01-01), Fukutomi et al.
patent: 2010/0017650 (2010-01-01), Chin et al.
patent: 2010/0083040 (2010-04-01), Voigt et al.
patent: 2010/0107021 (2010-04-01), Nagadomi et al.
Nitin Agrawal “Design Tradeoffs for SSD Performance” Jun. 2008.
Greenan, K., Long, D., Miller, E., Schwarz, T. and Wildani, A., “Building Flexible, Fault-Tolerant Flash-based Storage Systems,” Proceedings of the 5th Workshop on Hot Topics in System Dependability (HotDep 2009), Jun. 2009.
Endoh, T., Shimizu, K., Iizuka, H. and Masuoka, F., “A New Write/Erase Method to Improve the Read Disturb Characteristics Based on the Decay Phenomena of Stress Leakage Current for Flash Memories,” IEEE Transactions on Electron Devices, vol. 45, No. 1, pp. 98-104, Jan. 1998.
Lue, H.T., Lai, S.C., Hsu, T.H., Du, P.Y., Wang, S.Y., Hsieh, K.Y., Liu, R. and Lu, C.Y., “Understanding Barrier Engineered Charge-Trapping NAND Flash Devices With and Without High-K Dielectric,” The 47th Annual IEEE International Reliability Physics Symposium, Apr. 2009, pp. 874-882, Montreal.
Brand, A., Wu, K., Pan, S. and Chin, D., “Novel Read Distrub Failure Mechanism Induced By FLASH Cycling,” The 31st Annual IEEE International Reliability Physics Symposium, Mar. 1993, pp. 127-132, Atlanta, Georgia.
Takeuchi, K., Satoh, S., Tanaka, T., Imamiya, K.I. and Sakui, K., “A Negative Vth Cell Architecture for Highly Scalable, Excellently Noise-Immune, and Highly Reliable NAND Flash Memories,” IEEE Journal of Solid-State Circuits, vol. 34, No. 5, May 1999, pp. 675-684.
Cooke, J., “The Inconvenient Truths of NAND Flash Memory,” Memory Summit, Aug. 2007, Santa Clara, California.
Cooke, J., “Flash Memory Technology Direction,” Micron Technology, Inc., Microsoft WinHEC 2007, May 2, 2007.
Ji-Yong Shin et al., “FTL Design Exploration in Reconfigurable High-Performance SSD for Server Applications”, ICS 2009, Jun. 8-12, 2009, pp. 338-349, USA, copyright 2009 ACM.
Chin-Hsien Wu, “A Time-Predictable System Initialization Design for Huge-Capacity Flash-Memory Storage Systems”, Codes+ISSS 2008, Oct. 19-24, 2008, pp. 13-18, USA, copyright 2008 ACM.
Camp Charles J.
Fisher Timothy J.
Frost Holloway H.
Fuxa James A.
Shelton Lance W.
Bansal Gurtej
Bragdon Reginald G
Locke Lord Bissell & Liddell LLP
Texas Memory Systems, Inc.
LandOfFree
Efficient reduction of read disturb errors in NAND FLASH memory does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Efficient reduction of read disturb errors in NAND FLASH memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Efficient reduction of read disturb errors in NAND FLASH memory will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4187209