Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2007-01-25
2011-10-04
Rodriguez, Paul (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C703S002000, C716S054000
Reexamination Certificate
active
08032349
ABSTRACT:
Disclosed herein are embodiments of an automated, fast and efficient method of generating a customized compact model that represents a semiconductor device at the chip, wafer or multi-wafer level in a specific manufacturing environment. Specifically, measurement data is collected from a specific manufacturing environment and sorted by channel lengths. Then, an optimizer is used to generate customized modeling parameters based on the measurement data. The optimization processes is a multi-step process. First, a first set of modeling parameters is generated based on measurement data associated with a long channel length. Second, a second set of modeling parameters is generated based on the first set and on measurement data associated with a short channel length. Finally, the customized modeling parameters are generated based on both the first set and the second set. The customized modeling parameters are used to generate a customized compact device model representative of the specific manufacturing environment.
REFERENCES:
patent: 5719796 (1998-02-01), Chen
patent: 5966312 (1999-10-01), Chen
patent: 6185472 (2001-02-01), Onga et al.
patent: 6282693 (2001-08-01), Naylor et al.
patent: 6314390 (2001-11-01), Bittner et al.
patent: 6560568 (2003-05-01), Singhal et al.
patent: 6795800 (2004-09-01), Lee
patent: 6934671 (2005-08-01), Bertsch et al.
patent: 7263477 (2007-08-01), Chen et al.
patent: 2002/0133785 (2002-09-01), Kondo
patent: 2003/0220779 (2003-11-01), Chen et al.
patent: 2005/0086033 (2005-04-01), Chen et al.
Loo Sim Y.
Lovejoy Steven G.
Na Myung-Hee
Nowak Edward J.
Springer Scott K.
Gibb I.P. Law Firm LLC
International Business Machines - Corporation
Kotulak, Esq. Richard M.
Ochoa Juan C
Rodriguez Paul
LandOfFree
Efficient methodology for the accurate generation of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Efficient methodology for the accurate generation of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Efficient methodology for the accurate generation of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4267605