Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-11-27
2007-11-27
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
11152580
ABSTRACT:
A method of modeling electromagnetism in an irregular conductive plane, by dividing the surface into a grid of unequal and unaligned rectangles, assigning a circuit node location to a center of each rectangle, and calculating capacitive and inductive parameters based on the center circuit node locations. Rectangulation is accomplished using automated, recursive bisection. Capacitive segments are assigned to each circuit node and coincide with the corresponding rectangles. Inductive segments are assigned between adjacent rectangle pairs, with a width of an inductive segment defined as the common boundary of the corresponding pair of rectangles and the length of the inductive segment defined as the normal distance between circuit nodes of the two rectangles. Placement of the circuit nodes at the centers of the rectangles significantly reduces the number of nodes and segments, and provides a faster yet comprehensive analysis framework.
REFERENCES:
patent: 6665849 (2003-12-01), Meuris et al.
Albert Ruehli, “Equivalent Circuit Models for Three-Dimensional Multiconductor Systems,” IEEE Transactions on M.T.&T., vol. MTT-22, No. 3, pp. 216-221 (Mar. 1974).
“Fast Field Solvers FAQ” [online], [retrieved on May 18, 2005], retrieved from the Internet <URL: http://www.fastfieldsolvers.com/faq.htm>.
Beattie Michael W.
Devgan Anirudh
Krauter Byron L.
Zheng Hui
Do Thuan
Musgrove Jack V.
Salys Casimer K.
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