Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate
2005-04-19
2005-04-19
Nguyen, Van Thu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Including reference or bias voltage generator
C365S185010, C323S284000
Reexamination Certificate
active
06882582
ABSTRACT:
A voltage reference circuit (40) is provided for producing a low temperature-coefficient analogue trim value. A pair of EEPROMs (50and60) are arranged such that the trim value is the difference between two EEPROM transistor threshold voltages. The substantially temperature dependent components of threshold voltage cancel out leaving only the substantially temperature independent trim value. Therefor the temperature coefficient of the voltage reference circuit (40) is negligible.
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Carley, “Trimming Analog Circuits Using Floating-Gate Analog MOS Memory,” IEEE Journal of Solid-State Circuits, Dec. 24, 1989, No. 6; pp. 1569-1575.
Carman Eric Scott
Sicard Thierry
Freescale Semiconductor Inc.
Nguyen Van Thu
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