Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-11-17
2008-11-25
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07458051
ABSTRACT:
A semiconductor structure including at least one spare cell is disclosed. The semiconductor structure includes a first conductive line coupled to a power supply, and a second conductive line coupled to a complementary power supply. At least one spare cell is decoupled from the first or second conductive line for being selectively connected to at least one normally functioning electronic components, the first conductive line and the second conductive line only during a rerouting process for reducing leakage power of the semiconductor structure.
REFERENCES:
patent: 2004/0199879 (2004-10-01), Bradfield et al.
patent: 2005/0097492 (2005-05-01), Matsumura et al.
patent: 2005/0235240 (2005-10-01), Tien
patent: 2006/0259887 (2006-11-01), Tretz
Hou Yung-Chin
Lu Lee-Chung
Tien Li-Chun
Wang Chu-Ping
Dinh Paul
K&L Gates LLP
Taiwan Semiconductor Manufacturing Co. Ltd.
LandOfFree
ECO cell for reducing leakage power does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with ECO cell for reducing leakage power, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and ECO cell for reducing leakage power will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4036580