ECC circuit-containing semiconductor memory device and...

Details ECC circuit-containing semiconductor memory device and... ECC circuit-containing semiconductor memory device and...

2005-08-30

2005-08-30

Tu, Christine T. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S766000, C714S764000

Reexamination Certificate

active

06938193

ABSTRACT:
In an ECC circuit of an ECC circuit-containing semiconductor memory device, an error correcting code/syndrome generating circuit and a data correcting circuit are disposed. In portions of the ECC circuit connected to buses, a data bus input control circuit for controlling input of a data from a data bus; an error correcting code bus input control circuit for controlling input of an error correcting code from an error correcting code bus; and an error correcting code bus output control circuit for controlling output of an error correcting code to the error correcting code bus are disposed. A portion corresponding to an error correcting code generator of a conventional technique is included in the ECC circuit, so that the ECC circuit can function both as an error correcting code generator and a decoder. As a result, the entire device can be made compact.

REFERENCES:
patent: 4335459 (1982-06-01), Miller
patent: 4394763 (1983-07-01), Nagano et al.
patent: 4561095 (1985-12-01), Khan
patent: 4730320 (1988-03-01), Hidaka et al.
patent: 4903268 (1990-02-01), Hidaka et al.
patent: 5233610 (1993-08-01), Nakayama et al.
patent: 5463643 (1995-10-01), Gaskins et al.
patent: 5487077 (1996-01-01), Hassner et al.
patent: 5502732 (1996-03-01), Arroyo et al.
patent: 6295617 (2001-09-01), Sonobe
patent: 198-29-234 (1999-01-01), None
patent: 0 346 629 (1989-05-01), None
patent: 0 327 309 (1989-08-01), None
patent: 0-327-309 (1989-08-01), None
patent: 0-346-629 (1989-12-01), None
patent: 5-54697 (1993-03-01), None
patent: WO8000626 (1980-04-01), None
Notice of Rejection Reasons, “ECC Circuit-Containing Semiconductor Memory Device and Method of Testing the Same” Issued Apr. 24, 2002.

Affiliated with

Also associated with

Rating

ECC circuit-containing semiconductor memory device and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with ECC circuit-containing semiconductor memory device and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and ECC circuit-containing semiconductor memory device and... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3455652