Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-07-15
1999-06-08
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
3562371, 356394, 348126, G01B 1124
Patent
active
059108444
ABSTRACT:
A vision inspection system is provided in which eight optical images are instantaneously recorded on singular image frames which are output from two optical cameras. An illumination source is provided for illuminating four spaced apart inspection regions which are disposed about an inspection window. Two optical signals of reflected light emanate from each of the four inspection regions and are directed toward two optical cameras, with the two optical signals from each of the optical regions being at different viewing angles and preferably from a single focal point. Optical directing members receive the optical signals from the various regions and direct the light to respective ones of the cameras. The optical directing members are selectively adjustable for accommodating components of various sizes. The optical inspection of each component instantaneously occurs by recording the eight optical images, on two frames, one frame being recorded by each of the cameras. Four of the optical signals from two of the inspection regions are paired for input into one of the optical cameras and recorded on a singular frame. Four of the optical signals from the other two of the inspection regions are paired for input into the other of the optical cameras. The components passing over the optical inspection window may be inspected on the fly, without requiring stoppage of each of the components thereabove.
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Jones Brian H.
Phillips Dennis D.
Handley Mark W.
Pham Hoa Q.
Vistech Corporation
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