Static information storage and retrieval – Systems using particular element – Capacitors
Patent
1992-07-01
1994-11-08
LaRoche, Eugene R.
Static information storage and retrieval
Systems using particular element
Capacitors
365177, 257273, 257360, 257363, 257370, G11L 1124
Patent
active
053633253
ABSTRACT:
A bipolar transistor Q.sub.1 having a collector formed of a substrate region SUB of a MOS transistor M.sub.1, a base formed of the drain region of the MOS transistor and an emitter formed on the base and connected to a bit line BL is connected between the bit line BL and a memory cell MC formed of the MOS transistor M.sub.1 and and a capacitor C.sub.1 and the current amplifying operation of a bipolar transistor is used for data readout.
REFERENCES:
patent: 4677589 (1987-06-01), Haskell et al.
patent: 4961165 (1990-10-01), Ema
patent: 5031020 (1991-07-01), Momose
patent: 5198995 (1993-03-01), Dennard et al.
"A Block Oriented RAM with Half-Sized DRAM Cell and Quasi-folded Data Line Architecture", Kimura et al ISSCC91/Session 6/High Density DRAM/Paper TA 6.2, Mar. 1991 IEEE.
"Cell Plate Line Connecting Complementary Bitline (C.sup.3) Architecture For Battery Operating DRAMs", Asakura et al., LSI Research and Development Lab, Mitsubishi Electric Corporation.
Technical Digest of IEDM, "A Bipolar-EPROM (Bi-EPROM) Structure for 33 v Operation and High Speed Application" N. Matsukawa, et al., 1990, pp. 90-313-90-316.
Fuse Tsuneaki
Hasegawa Takehiro
Hieda Katsuhiko
Horiguchi Fumio
Nitayama Akihiro
Kabushiki Kaisha Toshiba
LaRoche Eugene R.
Niranjan F.
LandOfFree
Dynamic semiconductor memory device having high integration dens does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dynamic semiconductor memory device having high integration dens, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dynamic semiconductor memory device having high integration dens will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1788171