Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-05-10
2005-05-10
Ngô, Ngân V. (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S332000, C257S333000
Reexamination Certificate
active
06891225
ABSTRACT:
A semiconductor memory device comprising: a source diffusion layer formed on a semiconductor substrate and connected to a fixed potential line; a plurality of columnar semiconductor layers arranged in a matrix form and formed on the source diffusion layer and each having one end connected to the source diffusion layer commonly, the columnar semiconductor layer taking a first data state with a first threshold voltage that excessive majority carriers are accumulated in the columnar semiconductor layer, and a second data state with a second threshold voltage that excessive majority carriers are discharged from the columnar semiconductor layer; a plurality of drain diffusion layers each formed at the other end of the columnar semiconductor layer; a plurality of gate electrodes each opposed to the columnar semiconductor layer via a gate insulating film, and connected to the word line; a plurality of word lines each connected to corresponding the gate electrodes; and a plurality of bit lines each connected to corresponding the drain diffusion layers, the bit lines being perpendicular to the word lines.
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Horiguchi Fumio
Ohsawa Takashi
Banner & Witcoff , Ltd.
Ngo Ngan V.
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