Dynamic semiconductor memory circuit

Static information storage and retrieval – Read/write circuit – Testing

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36523006, G11C 2900

Patent

active

054327440

ABSTRACT:
A dynamic semiconductor memory circuit, having simultaneous select means composed of inverters and logic gates is provided. The simultaneous select means functions to simultaneously activate multiple drive circuits when a test mode signal TST is activated, therefore simultaneously selecting n word lines and reducing the time to perform a data hold test.

REFERENCES:
patent: 4906994 (1990-03-01), Hoffmann et al.
patent: 5289475 (1994-02-01), Slemmer

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