Static information storage and retrieval – Read/write circuit – Testing
Patent
1993-12-07
1995-07-11
Popek, Joseph A.
Static information storage and retrieval
Read/write circuit
Testing
36523006, G11C 2900
Patent
active
054327440
ABSTRACT:
A dynamic semiconductor memory circuit, having simultaneous select means composed of inverters and logic gates is provided. The simultaneous select means functions to simultaneously activate multiple drive circuits when a test mode signal TST is activated, therefore simultaneously selecting n word lines and reducing the time to perform a data hold test.
REFERENCES:
patent: 4906994 (1990-03-01), Hoffmann et al.
patent: 5289475 (1994-02-01), Slemmer
NEC Corporation
Popek Joseph A.
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