Dynamic random access memory trench capacitors

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

Reexamination Certificate

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Details

C257S225000, C257S223000

Reexamination Certificate

active

06891209

ABSTRACT:
DRAM trench capacitors formed by, inter alia, deposition of conductive material into a trench or doping the semiconductor region in which the trench is defined.

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