Dynamic random access memory that can be controlled by a...

Static information storage and retrieval – Addressing – Particular decoder or driver circuit

Reexamination Certificate

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C365S230080

Reexamination Certificate

active

06219297

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a semiconductor memory device, and more particularly, to a highly integrated dynamic random access memory (DRAM) that connects to a DRAM controller for a less integrated DRAM.
2. Description of the Related Art
DRAMs have been widely used in computers. In a computer, a DRAM controller controls writing and reading of data to and from the DRAMs. Accordingly, a row or column address output from a DRAM controller should have the same number of address bits as the address input to the DRAM, and the number of address pins of the DRAM controller should match the number of address pins of the DRAM.
Referring to
FIG. 1A
, a controller
101
for 128 Mb DRAM has twelve address pins
11
to
22
, and a 128 Mb DRAM
111
has twelve address pins
51
to
62
. Each of the twelve address pins
11
to
22
of controller
101
connects to a corresponding one of the twelve address pins
51
to
62
of 128 Mb DRAM
111
. Therefore, when reading from or writing to 128 Mb DRAM
111
, controller
101
issues a row address and a column address, each having up to twelve bits A
0
to A
11
through address pins
11
to
22
, and 128 Mb DRAM
111
receives the address bits through address pins
51
to
62
.
In contrast, referring to
FIG. 1B
, controller
101
has twelve address pins
11
to
22
for a 128 Mb DRAM, and a 256 Mb DRAM has thirteen address pins
71
to
83
and requires a row or column address with up to thirteen bits for access of the full address space of DRAM
131
. Since the number of address pins
11
to
22
supported by DRAM controller
101
is less than the number of address pins
71
to
83
required by DRAM
131
, DRAM controller
101
cannot control DRAM
131
.
Referring to
FIG. 2
, a conventional 256 Mb (64M×4 bits) DRAM
201
includes pads
250
to
262
, address buffers
270
to
282
, a row decoder
211
, first and second memory cell arrays
221
and
222
, I/O (input/output) line sense amplifiers
231
to
238
, and four pairs of I/O lines
100
to
103
. A column decoder and associated circuitry that also connect to pads
250
to
262
are not shown but are well known in the art. Similarly, arrays
221
and
222
are simplified to only show column lines associated with columns selected by a column address received via pads
250
to
262
.
The most significant row address bit A
12
of row address bits A
0
to A
12
determines which of first and second memory cell arrays
221
and
222
will operate. For example, when the most significant row address bit A
12
is logic high, bit A
12
enables a row line driver
215
which assert a signal for accessing memory cells coupled to one of word lines WL
0
to WL
n
that address bits A
0
to A
11
select. Bit A
12
disables a row line driver
216
from asserting the signal to word lines WL
0
to WL
n
in array
222
when row address bit A
12
is a logic high. I/O line sense amplifiers
231
to
234
amplify data signals from memory cells on the selected word line and output the data via I/O (input and output) lines
100
to
103
.
When the most significant row address bit A
12
is logic low, row address bits A
0
to A
11
select one of word lines WL
0
to WL
n
, and bit A
12
enables word line driver
216
to assert the access signal from a decoder
213
to the selected word line in second memory cell array
222
. Then, I/O line sense amplifiers
235
to
238
amplify data signals from memory cells on the selected word line and output the data via I/O (input and output) lines
100
to
103
.
Referring to
FIG. 3
, a conventional 256 Mb (32M×8 bits) DRAM
301
includes pads
350
to
362
, address buffers
370
to
382
, a row decoder
311
, first and second memory cell arrays
321
and
322
, sense amplifiers
331
to
346
, and pairs of I/O (input and output) lines
100
to
107
. 256 Mb (32M×8 bits) DRAM
301
has a similar structure and operation to those of 256 Mb (64M×4 bits) DRAM
201
of
FIG. 2
, but accesses eight (instead of four) columns in array
321
or
322
for a read or write. As in
FIG. 2
, circuitry associated with column decoding is not shown in
FIG. 3
but is well known in the art. For the 32M×8 memory fewer column address bits (i.e., twelve column address bits) are used rather than thirteen column address bits as in the 64M×4 memory. Both 64M×4 and 32M×8 use thirteen row address bits.
As mentioned above, a controller for 128 Mb DRAM cannot be used with conventional 256 Mb DRAM
201
or
301
of
FIGS. 2 and 3
because a conventional 128 MB DRAM controller only provides twelve row address bits and memories
201
and
301
require thirteen row address bits. Accordingly, when memory ICs in a computer are upgraded, the upgraded memory ICs require a new controller. For cost-effective memory IC upgrading, a memory IC that can be operated by a controller for a memory IC having less memory capacity is necessary.
SUMMARY OF THE INVENTION
According to an aspect of the present invention, a highly integrated DRAM allows a DRAM controller for a less highly integrated DRAM to control the highly integrated DRAM. Accordingly, a computer can implement a high capacity memory using high capacity DRAM ICs and a DRAM controller designed for lower capacity DRAM ICs.
According to one embodiment of the invention, a semiconductor memory device includes first and second memory cell arrays. Each array includes 2
n−1
word lines with each word line corresponding to a row address including (n−1) row address bits. A row decoder decodes first through (n−1)th row address bits and selects a word line from the word lines of the first memory cell array and a word line from the word lines of the second memory cell array. The DRAM replaces the most significant row address bit terminal among the n possible row address bits with a power supply voltage and a ground voltage to simultaneously enable the first and second memory cell arrays. Accordingly, the DRAM requires fewer row address bits than would normally be required for a DRAM IC of the same capacity. A plurality of pairs of input and output lines simultaneously transfer data bits from the first memory cell array and the second memory cell array.
In one embodiment, the semiconductor memory device is in a package including first through nth address pins for receiving address bits from the outside. The nth address pin is not electrically connected to provide the a row address bit to the semiconductor memory device. Instead, the fixed voltages are applied as described above to enable accesses simultaneous access to both memory cell arrays.
In a specific embodiment of the invention, a 256 Mb semiconductor memory device includes first and second memory cell arrays, and each memory cell array includes word lines associated with 12-bit row addresses. A row decoder decodes first through twelfth row address bits and selects the word lines among the word lines in the first memory cell array and the second memory cell array. Terminals of the row decoder for the thirteenth address bit receives a power supply voltage for one memory cell array and a ground voltage for the other memory cell array, and thereby simultaneously enables the first and second memory cell arrays. The 256 Mb device has 8 (or 16) input and output lines for 8 (or 16) bits of parallel data, including four (or eight) bits of data associated with the first memory cell array and four (or eight) bits of data associated with the second memory cell array.
The highly integrated or high capacity DRAM ICs according to the present invention can enlarge the memory capacity of a computer system using a DRAM controller for lower capacity DRAM ICs. Further, the architecture of the DRAM is flexible so that that wire bonding during packaging or electronic configuration can select the number of row address bits that the DRAM requires from a controller.


REFERENCES:
patent: 4884240 (1989-11-01), Dennison et al.
patent: 5633832 (1997-05-01), Patel et al.
patent: 5781481 (1998-07-01), Iwakiri
patent: 594

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