Dynamic random access memory having storage gate electrode groun

Static information storage and retrieval – Systems using particular element – Capacitors

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365182, 365226, 357 231, 307 15, 3072966, G11C 1124, G11C 1134, H01L 2978, H03K 301

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active

048796794

ABSTRACT:
A dynamic RAM provided on a semiconductor substrate comprises: a memory cell including a capacitor for storing electric charges as information, the capacitor having a storage gate electrode to which a potential other than a ground potential is applied during normal operation of the dynamic RAM; a peripheral circuit including a CMOS circuit; and grounding means for applying the ground potential to the storage gate electrode only in a predetermined period immediately after a start of application of a power supply voltage to the dynamic RAM.

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IEDM 85: "Static and Transient Latch-up Hardness in N-Well CMOS With On-Chip Substrate Bias Generator", by D. Takacs et al., 18.5, 1985, pp. 504-508.

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