Dynamic random access memory device with trench type memory cell

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257302, H01L 2968

Patent

active

051683369

ABSTRACT:
A dynamic random access memory cell comprises a switching transistor and a storage capacitor formed in a relatively deep trench and having a capacitor electrode projecting over the major surface of the semiconductor substrate, wherein the switching transistor comprises a source/drain region formed along a wall portion defining the relatively deep trench, another source/drain region formed in the major surface portion, a channel region extending partially along a wall portion defining a relatively shallow trench and partially beneath the major surface so that a channel length is prolonged, thereby decreasing an occupation area without any punch-through phenomenon.

REFERENCES:
patent: 4408304 (1983-10-01), Nashizawa
patent: 4897700 (1990-01-01), Nakamura
patent: 5027172 (1991-06-01), Jeon

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