Dynamic random access memory device and inspection method thereo

Static information storage and retrieval – Read/write circuit – Data refresh

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3241581, 365200, 365201, 371 102, G11C 700

Patent

active

054065224

ABSTRACT:
DRAM devices embodying the present invention have longer potential effective values of refresh interval. A self-refresh interval signal may be set in association with its refresh interval to minimize power consumption during the self-refresh operation mode. An inspection method may pick up DRAM devices with efficiency and without deterioration of yields. When self-refresh interval control signal SELFS assumes the logic level "H" to turn P channel type MOS transistor Qp off and N channel type MOS transistor Qn on, the node N14 is brought to ground voltage VSS. The P channel type MOS transistor Qp and the N channel type MOS transistor Qn determine the time constant at which oscillation is generated. The oscillation output is applied to memory cells of the DRAM devices to enable the self-refresh mode of operation.

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