Dynamic memory and method for testing a dynamic memory

Details Dynamic memory and method for testing a dynamic memory Dynamic memory and method for testing a dynamic memory

2006-08-15

2006-08-15

Le, Vu A. (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S222000

Reexamination Certificate

active

07092303

ABSTRACT:
The invention relates to a dynamic memory having a memory cell array, a test controller to test the memory cell array and an oscillator to control the refreshing of the memory cell array. According to the invention, the memory includes a device for using the oscillator as a time base for the test controller, such that a slow time base is achieved which may be used for different self-tests of the memory.

REFERENCES:
patent: 4672583 (1987-06-01), Nakaizumi
patent: 4827476 (1989-05-01), Garcia
patent: 5321661 (1994-06-01), Iwakiri et al.
patent: 5337282 (1994-08-01), Koike
patent: 5703823 (1997-12-01), Douse et al.
patent: 5831918 (1998-11-01), Merritt et al.
patent: 5862094 (1999-01-01), Kawabata et al.
patent: 5883843 (1999-03-01), Hii et al.
patent: 5995424 (1999-11-01), Lawrence et al.
patent: 6141280 (2000-10-01), Cho
patent: 6392948 (2002-05-01), Lee
patent: 199 04054 (1999-12-01), None

Affiliated with

Also associated with

Rating

Dynamic memory and method for testing a dynamic memory does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Dynamic memory and method for testing a dynamic memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dynamic memory and method for testing a dynamic memory will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3711022