DVI link with circuit and method for test

Details DVI link with circuit and method for test DVI link with circuit and method for test

2006-04-04

2006-04-04

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Transmission facility testing

C714S715000, C714S724000

Reexamination Certificate

active

07024601

ABSTRACT:
An embodiment includes encoding digital data into encoded digital data in a transition minimized differential signaling encoder, serializing the encoded digital data into encoded and serial digital data in a serializer, generating test data in a pseudo-random binary sequence generator circuit, transmitting the encoded and serial digital data through a multiplexer to a transmission medium in a normal mode of operation, and transmitting the test data through the multiplexer to the transmission medium in a test mode of operation. The encoder, the serializer, the sequence generator circuit, and the multiplexer may be fabricated in a single integrated circuit chip. The test data may be pseudo-random binary sequence data. The digital data may include data to generate colors in a visual image, and the encoded and serial digital data may be received, deserialized, decoded, and displayed in a display unit.

REFERENCES:
patent: 3956601 (1976-05-01), Harris et al.
patent: 4701916 (1987-10-01), Naven et al.
patent: 5274445 (1993-12-01), Overton et al.
patent: 5457700 (1995-10-01), Merchant
patent: 5553059 (1996-09-01), Emerson et al.
patent: 5761216 (1998-06-01), Sotome et al.
patent: 6069876 (2000-05-01), Lander et al.
patent: 6108801 (2000-08-01), Malhotra et al.
patent: 6408412 (2002-06-01), Rajsuman
patent: 2003/0070126 (2003-04-01), Werner et al.
patent: 0196152 (1986-10-01), None
patent: WO-01/73465 (2001-10-01), None
“Digital Visual Interface, Revision 1.0”,Digital Display Working Group, (1999),pp. 1-76.
“DVI Test and Measurement Guide, Revision 1.0”,DDWG Electrical Test Working Group, (2001),pp. 1-26.

Affiliated with

Also associated with

Rating

DVI link with circuit and method for test does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with DVI link with circuit and method for test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and DVI link with circuit and method for test will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3615036