Duty cycle correction circuit with frequency-dependent bias...

Electrical computers and digital processing systems: support – Clock – pulse – or timing signal generation or analysis

Reexamination Certificate

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C327S175000

Reexamination Certificate

active

06643790

ABSTRACT:

FIELD OF THE INVENTION
The present invention relates to signal conditioning systems, and more particularly to apparatus and methods for correcting duty cycle distortion.
ART BACKGROUND
In many electronic circuit applications, it is desirable to generate a clock signal having a duty cycle as near to 50% as possible. For example, in chip-to-chip signaling applications in which data is transmitted or received on both rising and falling edges of a clock, it is important that successive rising and falling edges of the clock signal are evenly spaced in time. Otherwise, setup and hold requirements of signaling components may be not be met during the shorter half-cycle. Applications that employ delay-locked loop (DLL) circuits are also sensitive to uneven spacing between successive rising and falling clock signal edges, particularly when they include mixing circuitry operating at the same frequency as the reference clock. In that case, uneven spacing between successive rising and falling edges of the incoming clock signal usually results in unequal spacing in the phase offsets of the mixer output signals, degrading the delay locking performance of the circuit.
FIGS. 1A
,
1
B and
1
C illustrate a prior art duty cycle correction circuit
12
and corresponding input and output clock waveforms. The duty cycle correction circuit
12
, referred to herein as a level-shifting corrector, receives an input clock signal (ICLK) and its complement (ICLK\) at respective inputs of a differential amplifier pair
14
A,
14
B. The differential pair
14
A,
14
B is biased by a current I
1
drawn by a constant current source
15
. The drain nodes of the differential pair, N
1
and N
2
, are coupled to a supply voltage through respective resistive elements R
1
and R
2
(typically implemented by diode-configured transistors), and are coupled to ground through respective capacitive elements C
1
and C
2
. Nodes N
1
and N
2
are also coupled to inputs of a buffer circuit
18
which isolates output clock signals OCLK and OCLK\.
Looking at the left leg of the differential pair
14
A,
14
B, as ICLK goes high, the voltage at N
1
begins to be pulled down through R
1
, discharging C
1
. Conversely, when ICLK goes low, the voltage at N
1
is pulled up through R
1
, charging C
1
with time constant R
1
C
1
. The net effect of this operation is to produce an output clock signal, OCLK, which is inverted and has slowed rising and falling edges relative to ICLK. The resistive and capacitive elements are balanced between the right and left legs (i.e., R
2
=R
1
and C
2
=C
1
), so the right leg of the differential pair produces OCLK\ with similar inversion and slowed rising and falling edges relative to ICLK\.
A second differential amplifier pair
16
A,
16
B is coupled to nodes N
1
and N
2
, and is biased by a current I
2
drawn by constant current source
17
. A charge pump
21
is coupled to receive the output clock signals, OCLK and OCLK\, and to charge capacitive elements C
3
and C
4
to steady state voltages according to the respective on-times of the output clock signals. Thus, if OCLK and OCLK\ are each at precisely 50% duty cycle, the voltage developed on C
3
and C
4
is equal, resulting in equal currents through the left and right legs of the second differential amplifier pair
16
A,
16
B (i.e., I
S1
=I
S2
) In this case, and currents I
S1
and I
S2
are said to be at level bias (I
2
/2), and OCLK and OCLK\ each swing equally about a threshold voltage (V
MID
), that is midway between nominal high and low signal levels. By contrast, if the duty cycle of OCLK exceeds 50% (meaning that the duty cycle of OCLK\ is correspondingly less than 50%), a higher voltage is developed on C
4
than on C
3
causing I
S1
to exceed level bias and I
S2
to fall below level bias. An increased steady state voltage drop across R
1
results from the increased I
S1
, and causes the DC level of OCLK to shift downward by an amount equal to (I
S1
−I
2
/2)*R
1
. Conversely, a decreased steady state voltage drop across R
2
results from the decreased I
S2
and causes the DC level of OCLK\ to shift upward by an amount equal to (I
2
/2−I
S2
)*R
2
.
FIGS. 1B and 1C
illustrate the situation described above, in which the duty cycle distortion in ICLK and ICLK\ result in a downward shift in the DC level of OCLK and an upward shift in the DC level of OCLK\. The duty cycle distortion in ICLK and ICLK\ is indicated by the uneven time periods (T
1
and T
2
) for the half cycles that make up each complete clock cycle (T
P
). Because the rising and falling edges of OCLK and OCLK\ have been slowed relative to the input clock signals, shifts in the levels of OCLK and OCLK\ have a pronounced effect on the time at which midpoint crossings occur. In particular, the downward shift of OCLK and the upward shift of OCLK\ delays the start of period T
1
and advances the end of period T
1
relative to the same period of the input clocks. Conversely, the start of period T
2
is advanced and the end of period T
2
is delayed. The net effect is to shorten the longer of the two time periods, T
1
, and to extend the shorter of the two time periods, T
2
, thus providing output clock signals having approximately 50% duty cycle.
The level shifting duty cycle corrector of
FIG. 1
has a number of undesirable characteristics. One such characteristic is that the capacitive components used to reduce the edge rates of the input clock signals must usually be selected according to a specified input clock frequency. If the circuit is operated above the specified frequency, the RC circuits used to slow the output clock edge rates may prevent the output clock signals from reaching full swing. Consequently, the output clock signals may be lost altogether if the level shifting circuit shifts the DC level such that the reduced differential swing prevents the output clock signals from crossing V
MID
. Conversely, if the circuit is operated at a lower than specified frequency, the edge rate reduction may be insufficient to produce the required level of duty cycle correction when the DC levels of the output clocks are shifted.
One solution to the above problem is to provide additional capacitive elements that may be selectively coupled in parallel with C
1
and C
2
. For example, C
1
and C
2
may be specified according to a lowest anticipated input clock frequency, and passgates or fusible logic may be used to couple additional capacitive elements as necessary to support higher input clock frequencies. For run-time configurability, register settings may be established at system start-up to couple additional capacitive elements according to a run-time determined input clock frequency. Unfortunately, these solutions generally involve additional circuitry along with factory setting or run-time support, increasing overall system cost and complexity.
Another undesirable characteristic of the level shifting duty cycle corrector of
FIG. 1
is that the level shifting circuitry itself does not scale well with frequency. Generally, the amount of DC shift required to provide duty cycle correction is inversely related to the frequency of the input clock. That is, a smaller DC shift is required at a higher frequency to provide the same percentage duty cycle correction that would be produced by a larger DC shift at a lower frequency. Unfortunately, the negative feedback loop in the level shifting duty cycle corrector shifts the DC level of the output clock signals according to the duty cycle distortion in the input clock waveform and essentially independently of the frequency of the input clock signal. Thus, even though a smaller DC shift is desired at higher frequency to correct a given percentage distortion, the level shifting corrector produces roughly the same DC shift over a wide range of frequencies.
Yet another undesirable characteristic of the level shifting duty cycle corrector of
FIG. 1
is that the circuit's operation is relatively sensitive to process variations

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