Electronic digital logic circuitry – Reliability
Reexamination Certificate
2007-11-27
2007-11-27
Tran, Anh Q. (Department: 2819)
Electronic digital logic circuitry
Reliability
C326S010000, C326S014000, C326S093000
Reexamination Certificate
active
11375390
ABSTRACT:
Systems and methods for mitigating the effects of soft errors in asynchronous digital circuits. Circuits are constructed using stages comprising doubled logic elements which are connected to c-elements that compare the output states of the double logic elements. The inputs of logic elements in a stage are inhibited from changing until the outputs of the c-elements of that stage are enabled. The c-elements inhibit the propagation of a soft error by halting the operation of the circuit until the temporary effects of the soft error pass.
REFERENCES:
patent: 7036059 (2006-04-01), Carmichael et al.
patent: 2005/0127971 (2005-06-01), Hoff
Dama Jonathan A.
Jang Wonjin
Martin Alain J.
Nystroem Mika
California Institute of Technology
Hiscock & Barclay LLP
Milstein Joseph B.
Tran Anh Q.
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