Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Warping of semiconductor substrate
Reexamination Certificate
2006-04-14
2008-12-30
Lee, Calvin (Department: 2892)
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
Warping of semiconductor substrate
Reexamination Certificate
active
07470599
ABSTRACT:
Methods are provided of fabricating a nitride semiconductor structure. A group-III precursor and a nitrogen precursor are flowed into a processing chamber to deposit a first layer over one side of the substrate with a thermal chemical-vapor-deposition process. A second layer is similarly deposited over an opposite side of the substrate using the group-III precursor and the nitrogen precursor. The substrate is cooled after depositing the first and second layers without substantially deforming a shape of the substrate.
REFERENCES:
patent: 7198671 (2007-04-01), Ueda
patent: 2006/0204776 (2006-09-01), Chen et al.
Bour David
Eaglesham David
Nijhawan Sandeep
Smith Jacob
Washington Lori
Applied Materials Inc.
Lee Calvin
Townsend and Townsend / and Crew LLP
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