Dual mode coating thickness measuring probe for determining the

Details Dual mode coating thickness measuring probe for determining the Dual mode coating thickness measuring probe for determining the

1996-10-03

1999-03-23

Strecker, Gerard

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324227, 324232, G01B 706, G01R 3312

Patent

active

058865225

ABSTRACT:
A dual-mode coating thickness measuring probe for determining the thickness of a coating on ferrous and non-ferrous substrates. The probe has a first winding assembly including an induction winding and two search or pick-up windings and a second winding assembly including a search winding disposed on a non-magnetic and non-conductive former. A magnetic cylindrical pin of a material with a high resistance to impact and abrasive wear passes through the first and second windings. A conductive non-magnetic coaxial screen through which the pin extends separates the first winding from the second winding. The position of the screen is such that it has a minimal effect on the second winding while shielding its field from the first winding. The first and second windings are connected to signal conditioning circuitry which produces outputs representing the coating thickness measured.

REFERENCES:
patent: 3922599 (1975-11-01), Steingroever et al.
patent: 3986105 (1976-10-01), Nix et al.
patent: 4503392 (1985-03-01), Fastritsky et al.
patent: 4602212 (1986-07-01), Hiroshima et al.
patent: 5191286 (1993-03-01), Fischer
patent: 5343146 (1994-08-01), Koch et al.
patent: 5467014 (1995-11-01), Nix

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