Dual-masked field isolation

Metal treatment – Barrier layer stock material – p-n type – With non-semiconductive coating thereon

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257509, 257510, H01L 2912, H01L 21762

Patent

active

061030201

ABSTRACT:
A field isolation process utilizes two or more isolation formation steps to form active areas on a semiconductor substrate. Each field isolation step forms a portion of the field isolation in a manner which reduces field oxide encroachment, in particular, by forming field oxide islands. The superposition of field isolation configurations define the desired active areas. A presently preferred dual-mask process may be carried out using a single masking stack, or more preferably using a masking stack for each isolation mask. The present isolation process further allows isolation features to be optimized for a variety of isolation requirements on the same integrated circuit.

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J.W. Lutze, A.H. Perera, and J.P. Krusius; Field Oxide Thinning in Poly Buffer LOCOS Isolation with Active Area Spacings to 0.1; Jun. 1990; vol. 137, No. 6.

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