Dual in-line memory module, memory test system, and method...

Details Dual in-line memory module, memory test system, and method... Dual in-line memory module, memory test system, and method...

2007-06-29

2010-02-23

Pham, Ly D (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S189050, C365S191000, C365S193000, C365S230030, C365S233100

Reexamination Certificate

active

07668028

ABSTRACT:
A dual in-line memory module (DIMM) for use in test includes a memory array with a plurality of memories, a test signal input/output unit, and a normal data input/output unit. The test signal input/output unit is provided in the respective memories to perform an input/output operation of a test signal with an external test mode controller for a test mode operation. The normal data input/output unit is provided in the respective memories to perform an input/output operation of a normal data with an external memory controller for a normal mode operation.

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Korean Office Action, with English Translation, issued in Korean Patent Application No. KR 10-2007-0041097, dated Dec. 23, 2009.

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