Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2006-08-08
2006-08-08
Wojciechowicz, Edward (Department: 2815)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S197000, C257S371000
Reexamination Certificate
active
07087470
ABSTRACT:
A semiconductor device and a method of fabricating the semiconductor device, the semiconductor device including: one or more FETs of a first polarity and one or more FETs of a second and opposite polarity, at least one of the one or more FETs of the first polarity having a gate dielectric having a thickness different from a thickness of a gate dielectric of at least one of the one or more FETs of the second polarity.
REFERENCES:
patent: 6191049 (2001-02-01), Song
patent: 6248618 (2001-06-01), Quek et al.
patent: 6602751 (2003-08-01), Oohashi
patent: 6653192 (2003-11-01), Ryoo
patent: 6716685 (2004-04-01), Lahaug
patent: 2001/0031523 (2001-10-01), Kimizuka
Anderson Brent A.
Hook Terence B.
International Business Machines - Corporation
Sabo William D.
Schmeiser Olsen & Watts
Wojciechowicz Edward
LandOfFree
Dual gate dielectric thickness devices does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dual gate dielectric thickness devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dual gate dielectric thickness devices will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3688971