Dual damascene

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438687, H01L 214763

Patent

active

06080663&

ABSTRACT:
A dual damascene process is provided. A dielectric layer is formed on a substrate having a conductive region. The dielectric layer is selectively doped to form a doped region aligned over the conductive region. The doped region, the dielectric layer underlying the doped region, and another part of the undoped dielectric layer are etched until the conductive region is exposed, so that a dual damascene opening exposing the conductive region and a trench are formed, wherein the dual damascene opening comprising a upper trench and a lower via hole. The dual damascene opening and the trench are filled with a conductive layer.

REFERENCES:
patent: 5904565 (1999-05-01), Nguyen et al.
patent: 5989623 (1999-11-01), Chen et al.
patent: 6008114 (1999-12-01), Li
patent: 6017817 (2000-01-01), Chung et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Dual damascene does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Dual damascene, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dual damascene will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1784434

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.