Dual damascene

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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Details

438639, 438666, 438668, H01L 214763

Patent

active

060872527

ABSTRACT:
An improved dual damascene process is provided. By a spacer formed on sidewalls of an oxide layer, the method can make a via plug and a metal layer serving as an interconnect simultaneously form in a self-aligned process. Therefore, it can successfully avoid misalignment while forming a via plug and an interconnect.

REFERENCES:
patent: 5916823 (1999-06-01), Lou et al.
patent: 6025276 (2000-02-01), Donohoe et al.
patent: 6037194 (2000-03-01), Bronner et al.

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