Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2005-12-15
2008-10-14
Iqbal, Nadeem (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
Reexamination Certificate
active
07437616
ABSTRACT:
The same microcontroller chip is configured to be either a Target version or a Link version of a microcontroller. The Target version runs an application program. To debug the Target microcontroller, the Link version of the microcontroller functions as a master debug microcontroller to the slave Target microcontroller running the application program. The Link microcontroller runs an interface translator program between a Host computer that runs a debug program, and the Target microcontroller. The Link microcontroller communicates with the Target microcontroller using a fast, 2-wire interface. The Link microcontroller communicates with the Host computer through a general purpose interface.
REFERENCES:
patent: 5053949 (1991-10-01), Allison et al.
patent: 5737516 (1998-04-01), Circello et al.
patent: 5978937 (1999-11-01), Miyamori et al.
patent: 6094530 (2000-07-01), Brandewie
patent: 6173419 (2001-01-01), Barnett
patent: 6202172 (2001-03-01), Ponte
patent: 6249881 (2001-06-01), Porten et al.
patent: 6691258 (2004-02-01), Herold et al.
patent: 6915416 (2005-07-01), Deng et al.
Au Andrew K.
Froemming Benjamin F.
Lambrache Emil
Atmel Corporation
Iqbal Nadeem
Schwegman Lundberg & Woessner, P.A.
LandOfFree
Dual CPU on-chip-debug low-gate-count architecture with... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dual CPU on-chip-debug low-gate-count architecture with..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dual CPU on-chip-debug low-gate-count architecture with... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4018767