Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2011-08-30
2011-08-30
Graybill, David E (Department: 2894)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C228S004500, C228S180500, C228S904000
Reexamination Certificate
active
08008183
ABSTRACT:
The invention discloses apparatus and methods for the formation of bond wires in integrated circuit assemblies by attaching two separate wires using a dual capillary bond head. The separate wires are preferably non-identical, for example, being of different gauges and/or material composition. According to a preferred embodiment of the invention, dual capillary bond head apparatus includes a rotatable ultrasonic horn with a pair of capillaries for selectably dispensing separate strands of bond wire and for forming bonds on bond targets. According to another aspect of the invention, a method is provided for dual capillary IC wirebonding including steps for using two dual capillary bond heads for contemporaneously attaching non-identical bond wires to selected bond targets on one or more IC package assemblies.
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Derwent English abstract and one clipped image from KrR724065 B1, Apr. 6, 2007, pgs.
Bon David Joseph
Malolepszy Sean Michael
Pirkle Rex Warren
Brady III Wade J.
Graybill David E
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
Tung Yingsheng
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