Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent
1995-09-01
1997-06-24
Hantis, K.
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
356319, 356326, G01J 330
Patent
active
056421907
ABSTRACT:
A dual-axis plasma imaging system for use in spectroscopic analysis of material. The system includes a plasma torch having a tubular member with an upstream inlet end for receiving a flow of material to be analyzed and a downstream end for discharge of the material. An induction coil is provided for effecting plasma optical emission from the material, and a spectrometer for analyzing the emission. A first optical imaging device collects and focuses an axial emission component onto a primary aperture of the spectrometer. The first device is in a principal optical path between the tubular member and the spectrometer. A second optical imaging device in a secondary optical path collects and focuses a radial emission component onto the primary aperture of the spectrometer. The secondary path is angularly offset from the principal path. A folding mirror in the principal optical path, when in a stowed position, permits the first device to collect and focus the axial emission component onto the primary aperture. In an operative position, the mirror permits the second device to collect and focus the radial emission component onto the primary aperture. A system is provided for communicating the radial emission component to the folding mirror.
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Abstract of paper presented by Perkin Elmer Corporation, Abstract No. 576, FACSS XXII Meeting, Oct. 15-20, 1995.
Advertisement of Leeman Labs, Inc., (SAS) New England Section Newsletter, vol. 1, No. 2, Oct., 1995.
Krupa Robert J.
Owen Edward E.
Hantis K.
Thermo Jarrell Ash Corp.
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