Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2007-08-28
2007-08-28
Chen, Kin-Chan (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C438S718000
Reexamination Certificate
active
10782723
ABSTRACT:
Accordingly, this invention relates to an dry etching process for semiconductor wafers. More particularly, the present invention discloses a dry etching process including a halogen etchant (24) and a nitrogen gas (28) that selectively etches a compound semiconductor material (18) faster than the front-side metal layers (16A)(16B). Further, the dry etching process produces a vertical wall profile on compound semiconductor material (18) in both X (38) and Y (40) crystalline directions without undercutting the top of a via-opening.
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Barsky Mike
Sheng Huai-Min
Wang Jennifer
Chen Kin-Chan
LaRiviere Grubman & Payne, LLP
Northrop Grumman Corporation
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