Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation
Reexamination Certificate
2011-06-07
2011-06-07
Le, Thao X (Department: 2892)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
Insulated gate formation
C257S369000, C257SE21638, C438S183000
Reexamination Certificate
active
07955963
ABSTRACT:
The present invention provides a device having an N type polysilicon gate and a P type polysilicon gate disposed therein, wherein when both gates are simultaneously etched, they are disposed in such a manner that the area of a non-doped polysilicon gate corresponding to a dummy electrode becomes larger than the total area of the N type and P type doped polysilicon gates, thereby causing non-doped polysilicon to become dominant over doped polysilicon, whereby the polysilicon gates are dry-etched.
REFERENCES:
patent: 4989057 (1991-01-01), Lu
patent: 5116778 (1992-05-01), Haskell et al.
patent: 5637900 (1997-06-01), Ker et al.
patent: 5665203 (1997-09-01), Lee et al.
patent: 5783850 (1998-07-01), Liau et al.
patent: 5827761 (1998-10-01), Fulford et al.
patent: 5998247 (1999-12-01), Wu
patent: 6020240 (2000-02-01), Wu
patent: 6103603 (2000-08-01), Han
patent: 6117723 (2000-09-01), Huang
patent: 6175136 (2001-01-01), Okamura
patent: 6376294 (2002-04-01), Tzeng et al.
patent: 6429067 (2002-08-01), Liu et al.
patent: 6541359 (2003-04-01), Gabriel et al.
patent: 6605543 (2003-08-01), Zheng
patent: 6703269 (2004-03-01), Brown et al.
patent: 2003/0015763 (2003-01-01), Yoneda
patent: 11-204506 (1999-07-01), None
patent: 2000-058511 (2000-02-01), None
patent: 2000-164732 (2000-06-01), None
Kraig William F
Le Thao X
Oki Semiconductor Co., Ltd.
Rabin & Berdo P.C.
LandOfFree
Dry etching method for semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dry etching method for semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dry etching method for semiconductor device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2626894