Dry etching method for oxide semiconductor film

Etching a substrate: processes – Gas phase etching of substrate

Reexamination Certificate

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C438S706000

Reexamination Certificate

active

08034248

ABSTRACT:
Provided is a dry etching method for an oxide semiconductor film made of In—Ga—Zn—O, in which an etching gas containing a hydrocarbon is used in a dry etching process for the oxide semiconductor film made of In—Ga—Zn—O formed on a substrate.

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