Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step
Patent
1983-12-12
1985-01-08
Powell, William A.
Adhesive bonding and miscellaneous chemical manufacture
Delaminating processes adapted for specified product
Delaminating in preparation for post processing recycling step
156345, 156646, 204192E, 204298, H01L 21306, B44C 122, C03C 1500, C23F 102
Patent
active
044926103
ABSTRACT:
A dry etching method and device involve induction of a magnetic field having field lines perpendicular to an electric field by magnets which are arranged in the vicinity of a cathode within a reaction chamber, on the surface of the cathode being placed a sample to be etched by a plasma of an etchant gas.
REFERENCES:
patent: 3669861 (1972-06-01), Cash et al.
patent: 3757733 (1973-09-01), Reinberg
patent: 3855612 (1974-12-01), Rosuold
patent: 3968018 (1976-07-01), Lane et al.
patent: 4011143 (1977-03-01), Del Monte et al.
patent: 4094732 (1978-06-01), Reinberg
patent: 4247383 (1981-01-01), Greue et al.
patent: 4312731 (1982-01-01), Morrison
patent: 4384933 (1983-05-01), Takasaki
Vossen, ed., Thin Film Processes, Acedemic Press, New York, N.Y., (1978), pp. 48, 49, 76, 77, 107, 108, 497, 498.
Meckel et al., "Magnetron . . . Materials", Research Disclosure, (10/79), pp. 537-540.
"2400-85 A Planar Magnetron Sputtering System", Perkins-Elmer Ultek Inc., Palo Alto, Ca., (3/77).
Horiike et al., "High-Rate . . . Discharge", Jap. J. of Applied Physics, vol. 20, No. 11, (1981), pp. 817-820.
A catalogue of an apparatus for sale: Tokuda Seisakusho, Ltd.
Horiike Yasuhiro
Okano Haruo
Powell William A.
Tokyo Shibaura Denki Kabushiki Kaisha
LandOfFree
Dry Etching method and device therefor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dry Etching method and device therefor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dry Etching method and device therefor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-112649