Dry etching method

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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Details

156643, 156646, 156662, 156653, 156657, H01L 2100

Patent

active

053762282

ABSTRACT:
A dry etching method wherein an etching gas containing carbonyl sulfide or COS is used. If carbonyl and C--O bonds derived from COS are introduced into a decomposition product of a resist mask 4, film quality of carbonaceous polymer becomes rigid, thereby exhibiting, despite a small amount of deposition, improvements in selectivity to the resist and selectivity to Si. CO* released from COS extracts O atoms in an SiO.sub.2 interlayer insulation film 3, and contributes to high etchrate. Sulfur or S contributes to surface protection along with carbonaceous polymer. If CH.sub.x F.sub.4-x, C.sub.m F.sub.n, S.sub.2 F.sub.2 and the like are used jointly with COS, further improvements can be achieved in high etchrate, high selectivity and low pollution.

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