Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression
Reexamination Certificate
2005-01-18
2005-01-18
Frejd, Russell (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Modeling by mathematical expression
C703S014000, C327S170000, C716S030000
Reexamination Certificate
active
06845348
ABSTRACT:
A method for modeling the output waveform of a cell driving a resistance-capacitance network includes multiple effective capacitances. A method of calculating Thevenin parameters includes the steps of (a) initializing estimates of effective capacitances Ceff1 and Ceff2, of a switching threshold delay t0, and of a slope delay deltat; (b) solving ramp response equations for t0 and deltat as a function of Ceff1 and Ceff2; (c) comparing the estimates of t0 and deltat with solutions for t0 and deltat found in step (b); and (d) replacing the estimates of t0 and deltat with the solutions for t0 and deltat if the solutions for t0 and deltat have not converged to the estimates of t0 and deltat.
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Bhutani Sandeep
Dixit Charutosh
Krishnamurthy Prabhakaran
Subbarao Prasad
Fitch Even Tabin & Flannery
Frejd Russell
LSI Logic Corporation
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