Static information storage and retrieval – Read/write circuit – Accelerating charge or discharge
Reexamination Certificate
2006-11-14
2006-11-14
Mai, Son L. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Accelerating charge or discharge
C365S203000, C365S230030
Reexamination Certificate
active
07136317
ABSTRACT:
A random access memory (RAM), such as a dynamic RAM (DRAM) or embedded DRAM (eDRAM) on a CMOS integrated circuit (IC) logic chip. Memory banks drive one line of a connected global data line pair to develop a difference signal on the pair. Simultaneously, a global signal monitor line discharges to develop a signal that mirrors the signal developing on one of the pair. When the global signal monitor line discharges sufficiently to indicate that the difference signal is large enough to sense, a global sense control sets a global data sense amplifier, the memory banks drive shuts off, and the global sense control initiates restoring global data line.
REFERENCES:
patent: 5229967 (1993-07-01), Nogle et al.
patent: 5959918 (1999-09-01), Arimoto
patent: 6295244 (2001-09-01), Kim et al.
patent: 2005/0146957 (2005-07-01), Lee et al.
Hanson David R.
Kim Hoki
Mai Son L.
Peterson Charles W.
Schnurmann H. Daniel
LandOfFree
DRAM with self-resetting data path for reduced power... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with DRAM with self-resetting data path for reduced power..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and DRAM with self-resetting data path for reduced power... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3671813