DRAM testing method

Details DRAM testing method DRAM testing method

2009-12-18

2011-10-25

Gaffin, Jeffrey A (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S006320, C714S719000, C365S201000, C702S117000, C702S119000

Reexamination Certificate

active

08046644

ABSTRACT:
A method for testing a dynamic random access memory (DRAM) includes copying a test program from the DRAM to a random access memory (RAM). Start and end physical addresses of the DRAM are respectively stored in first and second registers. First test data is written to the start physical address, and second test data is read from the start physical address. The method further includes determining whether the second test data is the same as the first test data. A fixed value is added to the start physical address to obtain a next start physical address if the second test data is the same as the first test data. The method further includes determining whether the next start physical address is less than the end physical address. A test success result is returned if the next start physical address is not less than the end physical address.

REFERENCES:
patent: 4028667 (1977-06-01), Breslau et al.
patent: 5923599 (1999-07-01), Hii et al.
patent: 6707313 (2004-03-01), Rohrbaugh et al.
patent: 6728916 (2004-04-01), Chen et al.
patent: 6769081 (2004-07-01), Parulkar
patent: 7073100 (2006-07-01), Chadwick et al.
patent: 7788543 (2010-08-01), Chen
patent: 2002/0089887 (2002-07-01), Hii et al.
patent: 2005/0283566 (2005-12-01), Callaghan
patent: 2009/0100305 (2009-04-01), Jan et al.
patent: 2009/0125762 (2009-05-01), Wang

Affiliated with

Also associated with

Rating

DRAM testing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with DRAM testing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and DRAM testing method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4298721