Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2007-01-09
2007-01-09
Phung, Ahn (Department: 2824)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S205000, C365S207000
Reexamination Certificate
active
10627955
ABSTRACT:
A DRAM including an array of storage elements arranged in lines and columns, and for each column: write means adapted to biasing at least a selected one of the elements to a charge level chosen from among a first predetermined high level and a second predetermined low level, combined with read circuitry adapted to determining whether the stored charge level is greater or smaller than a predetermined charge level; and isolation circuitry adapted to isolating the array from the read and/or write means, each column further including refreshment means, distinct from the read and write circuit, for increasing, beyond the first and second predetermined levels, the charge stored in a storage element.
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French Search Report from French Patent Application No. 00/17294, filed Dec. 29, 2000.
Ferrant Richard
Jacquet François
Morris James H.
Nguyen Hien N
Phung Ahn
STMicroelectronics S.A.
Wolf Greenfield & Sacks P.C.
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