DRAM cell structure with buried surrounding capacitor and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S300000, C257S301000, C257S516000, C257S532000, C257SE27092, C257SE29346, C438S155000, C438S244000

Reexamination Certificate

active

11062563

ABSTRACT:
A memory device that includes a semiconductor substrate, and an array of memory cells, each cell being electrically isolated from adjacent cells and including an island formed from the substrate, the island having a top portion and at least one sidewall portion, and being spaced apart from other islands by a bottom surface on the substrate, a capacitor formed contiguous with the sidewall portion, and a transistor formed on the top portion of the island, the transistor including a gate oxide layer formed on a surface of the top portion, a gate formed on the gate oxide layer, and a first and a second diffused regions formed in the top portion, the first diffused region being spaced apart from the second diffused region.

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patent: 5223447 (1993-06-01), Lee et al.
patent: 5684313 (1997-11-01), Kenney
patent: 5981332 (1999-11-01), Mandelman et al.
patent: 6090661 (2000-07-01), Perng et al.
patent: 6180973 (2001-01-01), Ozaki
patent: 2001/0000689 (2001-05-01), Kajiyama
patent: 2002/0127811 (2002-09-01), Noble
patent: 2002/0191455 (2002-12-01), Richter et al.

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