Static information storage and retrieval – Interconnection arrangements
Reexamination Certificate
2005-03-22
2005-03-22
Phung, Anh (Department: 2824)
Static information storage and retrieval
Interconnection arrangements
C365S072000, C365S201000
Reexamination Certificate
active
06870750
ABSTRACT:
The present invention includes a DRAM array. The DRAM array includes a first memory cell, a second memory cell and an isolation gate formed between the first and second memory cells. The isolation gate is configured to provide electrical isolation between the first and second memory cells. The DRAM also includes a first switch having first and second load electrodes and a control electrode configured to accept a first control signal. The first load electrode is coupled to the isolation gate and the second load electrode is coupled to ground. The DRAM additionally includes a second switch having first and second load electrodes and a control electrode configured to accept a second control signal. The first load electrode is coupled to the isolation gate and the second load electrode is coupled to a stress voltage source.
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Micro)n Technology, Inc.
Nguyen Hien
Phung Anh
Wells St. John P.S.
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