Drain triggered N-channel non-volatile memory

Static information storage and retrieval – Systems using particular element – Semiconductive

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357 235, 357 41, G11C 1140, H01L 2978, H01L 2702

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active

046113088

ABSTRACT:
An electrically alterable non-volatile memory for storing information is described incorporating an array of memory elements comprising N-channel variable threshold field effect transistors having at times an N-channel extending from its source to a predetermined distance from its drain, means for writing information into the array and means for reading information from the array.

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patent: 4138737 (1979-02-01), McCann
patent: 4193128 (1980-03-01), Brewer
Iyer "Protective Device for MOS Integrated Circuits" Proc. IEEE vol. 56 (7/68) pp. 1223-1224.

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