Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering
Reexamination Certificate
2005-03-14
2010-12-14
Nguyen, Nam X (Department: 1795)
Chemistry: electrical and wave energy
Processes and products
Coating, forming or etching by sputtering
C204S192120, C204S298110, C204S298260
Reexamination Certificate
active
07850827
ABSTRACT:
A double-layer shutter control method of a multi-sputtering system provided with three targets in a single chamber and a double-layer rotating shutter mechanism having shutter plates which independently rotate and have holes formed therein, comprising selecting a target by a combination of holes of a first shutter plate and a second shutter plate and uses the selected target for a pre-sputtering step and a main sputtering step with continuous discharge so as to deposit a film on a substrate, whereby it is possible to prevent cross-contamination between targets due to target substances etc. deposited on the shutter plates.
REFERENCES:
patent: 3864239 (1975-02-01), Fletcher et al.
patent: 4576699 (1986-03-01), Sato et al.
patent: 6051113 (2000-04-01), Moslehi
patent: 2002/0064595 (2002-05-01), Nomura et al.
patent: 2004/0084305 (2004-05-01), Fukuchi et al.
Miki Hiroshi
Miyoshi Ayumu
Nomura Shuji
Berman Jason M
Buchanan & Ingersoll & Rooney PC
Canon Anelva Corporation
Nguyen Nam X
LandOfFree
Double-layer shutter control method of multi-sputtering system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Double-layer shutter control method of multi-sputtering system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Double-layer shutter control method of multi-sputtering system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4196431