Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-06-23
2008-08-19
Pert, Evan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S410000, C257S401000, C257S649000, C257SE29022
Reexamination Certificate
active
07414290
ABSTRACT:
A double gate transistor comprises a substrate (105, 905) and first and second electrically insulating layers (110, 910), (120, 920). The first and second electrically insulating layers form a fin (130, 930). A first gate dielectric (140,940) is at a first side (131, 931) of the fin and a second gate dielectric (150, 950) is at a second side (132, 932) of the fin. A first metal region (160, 960) is adjacent to the first gate dielectric and has a first surface (161, 961), and a second metal region (170, 970) is adjacent to the second gate dielectric and has a second surface (171, 971). The first electrically insulating layer has a third surface (111, 911), the second electrically insulating layer has a fourth surface (121, 921), and the first surface and the second surface lie between the third and fourth surfaces.
REFERENCES:
patent: 7053449 (2006-05-01), Segura et al.
patent: 7148526 (2006-12-01), An et al.
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Ban Ibrahim
Shah Uday
Intel Corporation
Mandala Jr. Victor A.
Nelson Kenneth A.
Pert Evan
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