Electronic digital logic circuitry – Clocking or synchronizing of logic stages or gates – Field-effect transistor
Reexamination Certificate
2007-01-31
2010-12-21
Barnie, Rexford N (Department: 2819)
Electronic digital logic circuitry
Clocking or synchronizing of logic stages or gates
Field-effect transistor
C326S095000
Reexamination Certificate
active
07855578
ABSTRACT:
Circuits are provided for simultaneously reducing the subthreshold and gate oxide leakage power consumption in domino logic circuits. Sleep transistors and a dual threshold voltage CMOS technology may be utilized to place idle domino logic circuits into a low leakage state. The circuits may significantly lower the total leakage power as compared to the standard dual threshold voltage domino logic circuits at both the high and low die temperatures. The energy overheads of the circuit techniques may be low, justifying the activation of the proposed sleep schemes by providing net savings in total power consumption during short idle periods.
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Kursun Volkan
Liu Zhiyu
Barnie Rexford N
Boyle Fredrickson , S.C.
Hammond Crystal
Wisconsin Alumni Research Foundation
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